An analysis system for analysing the condition of

专利名称：An analysis system for analysing the

condition of a machine

发明人：Lindberg, Stefan,Hedlund,

Håkan,Kummelstam, Jim,Lindberg, Jarl-Ove

申请号：EP12171674.0申请日：20030120公开号：EP2505984B1公开日：20170920

摘要：An apparatus (14) for monitoring the condition of a machine (6), comprising: (a)at least one input (42) for receiving measurement data from a sensor (10) for surveying ameasuring point (12) of the machine (6); (b) data processing means (50) for processingcondition data dependent on said measurement data; said data processing means (50)comprising means for performing at least two condition monitoring functions (F1, F2, ...,Fn); (c) at least one of said at least two of condition monitoring functions (F1, F2, ..., Fn)having a disabled state and an enabled state; said disabled state prohibiting completeexecution of said condition monitoring function; and said enabled state allowingexecution; (d) means for changing the state of a selected condition monitoring functionbetween the disabled state and the enabled state, and (e) a communication port (16) forreceiving a key comprising a code for enabling a selected condition monitoring function(F1, F2, ..., Fn) from a first predetermined date until a second date, (f) clock functionality(210) for providing time and date information, wherein said apparatus (14) is adapted tochange the state of the selected condition monitoring function (F1, F2, ..., Fn) from thedisabled state to the enabled state from said first predetermined date until said second

date.

申请人：SPM INSTR AB

地址：SE

国籍：SE

代理机构：Zacco Sweden AB

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