专利名称：Analog signal test circuits and methods发明人：Weiqi Ding,Sergey Shumarayev申请号：US13475256申请日：20120518公开号：US09429625B1公开日：20160830
专利附图：
摘要：An analog test network includes a conductor. The conductor is coupled toprovide a first analog signal from a circuit under test to an analog-to-digital convertercircuit. The analog-to-digital converter circuit is operable to generate a first digital signalbased on the first analog signal. A control circuit is operable to generate a second digital
signal based on the first digital signal. A digital-to-analog converter circuit is operable togenerate a second analog signal based on the second digital signal. The conductor iscoupled to provide the second analog signal from the digital-to-analog converter circuitto the circuit under test.
申请人：Weiqi Ding,Sergey Shumarayev
地址：Fremont CA US,Los Altos Hills CA US
国籍：US,US
代理人：Steven J. Cahill
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