专利名称：METHOD OF DETERMINING THE
DEFLECTION OF AN ELECTRON BEAMRESULTING FROM AN ELECTRIC FIELDAND/OR A MAGNETIC FIELD
发明人：Benedikt HAAS,David COOPER,Jean-Luc
ROUVIERE
申请号：US15703557申请日：20170913
公开号：US20180076005A1公开日：20180315
专利附图：
摘要：Method of determining a local electric field and/or a local magnetic field in asample and/or the dielectric constant of a material and/or the angle between the inputand output surfaces of the sample, comprising the following steps:
申请人：COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
地址：Paris FR
国籍：FR
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