专利名称:Power supply, a semiconductor making
apparatus and a semiconductor waferfabricating method using the same
发明人:Youji Takahashi,Tsutomu Iida,Tsuyoshi
Umemoto,Makoto Kashibe
申请号:US10653907申请日:20030904公开号:US07125730B2公开日:20061024
专利附图:
摘要:In power supply and a semiconductor making apparatus and a semiconductor
fabricating method using the same, an abnormality can be detected when an offsetoccurs in a part constituting a closed-loop system of high-frequency power supply or dcpower supply for a semiconductor making apparatus. Power supply for receiving a powervalue setting signal to set strength of power and a power on/off instruction to set on oroff of outputting of the power interrupts the supply of the power even in a state in whicha subsequent power on/off instruction is on if a power sense signal according to a valueobtained by sensing the power exceeds a predetermined value when the power on/offinstruction is off.
申请人:Youji Takahashi,Tsutomu Iida,Tsuyoshi Umemoto,Makoto Kashibe
地址:Kudamatsu JP,Kudamatsu JP,Yamato JP,Tokuyama JP
国籍:JP,JP,JP,JP
代理机构:Antonelli, Terry, Stout and Kraus, LLP.
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