专利名称：Resistance measuring arrangement发明人：William H. Beaubien申请号：US06/260303申请日：19810504公开号：US04408157A公开日：19831004
摘要：The invention employs a pair of known resistors which are permanentlyconnected to the input terminals to which the unknown resistor may be connected. Asource of d.c. voltage is connected to one input terminal and the voltage drops producedacross each known resistor are alternately sampled and supplied to an A/D converterwhich converts these voltage drops into corresponding digital signals. A microprocessorcomputes the quantity VR1/VR2-1 where VR1 is the voltage drop across one knownresistor and VR2 is the voltage drop across the other known resistor. The computedquantity is a linear function of the value of the unknown resistance. This computedquantity may then be converted to a corresponding analog signal and supplied to ameter. Since no switches are connected across the unknown resistor, leakage problemsnormally associated with extremely high resistance measurements are virtuallyeliminated and very high resistances in the order of 5000-10,000 megohms may beaccurately measured and displayed.
申请人：ASSOCIATED RESEARCH, INC.
代理机构：Mason, Kolehmainen, Rathburn & Wyss
更多信息请下载全文后查看
因篇幅问题不能全部显示，请点此查看更多更全内容