专利名称：Method for measuring optical characteristics
of diffraction optical element and apparatusfor measuring optical characteristics ofdiffraction optical element
发明人：Takamasa Ando,Tsuguhiro Korenaga申请号：US12442674申请日：20071213公开号：US08089620B2公开日：20120103
专利附图：
摘要：A measurement method and an evaluating apparatus are provided which are
capable of easily and accurately evaluating the light amount of a spot beam, thediffraction efficiency, and the intensity distribution in the optical axis direction bydetecting even a weak diffracted beam in an arbitrary wavelength range converged by adiffraction optical element as an imaging lens.
申请人：Takamasa Ando,Tsuguhiro Korenaga
地址：Osaka JP,Osaka JP
国籍：JP,JP
代理机构：McDermott Will & Emery LLP
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